SK Hynix Integrates Infinitesima’s Metron³D for Advanced DRAM Quality Control

SK hynix, a leading DRAM maker, has deployed Infinitesima’s Metron³D 300 mm in-line wafer metrology system in its production lines. This high-speed 3D atomic force microscope tool offers sub-nanometer accuracy and operates up to 100× faster than traditional AFM systems, enabling real-time defect detection during chip production.

A spokesperson from SK hynix’s Defect Analysis, Metrology, and Inspection (DMI) group emphasized the importance of 3D process control:

“Three-dimensional process control at the nano-scale level is increasingly being recognized as essential for ensuring high yield in advanced DRAM processes. Excellent sub-nanometre 3D metrology was demonstrated by Infinitesima’s Metron³D, along with the required cost-of-ownership necessary for HVM implementation.”

Why This Matters:

• Quality at Scale: Real-time scanning helps SK hynix maintain high margins by minimizing defective chips in mass production.
• Next-Gen Memory Demands: With AI piles needing more HBM stacks, precision tools like Metron³D become essential in manufacturing HBM4E and beyond.
• Metrology Innovation: This move signals industry-wide adoption of AFM-based metrology in fabs—infant technology that now scales for real factories  .

SK Hynix’s rollout marks a shift toward smarter, data-driven memory production—defining the next wave of semiconductor manufacturing, especially for performance-critical AI and graphics memory.