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Teradyne Expands Power Semiconductor Test Portfolio with ETS-800 Dual-Sector System

Published: 10.14.2025

Teradyne has introduced a new automated test system designed to streamline both high-volume and low-mix power semiconductor production.


The new platform, called the ETS-800 D20, allows manufacturers to test power devices such as IGBTs, MOSFETs, and wide-bandgap SiC and GaN components, using a single flexible system that can handle different production scales.


Teradyne Expands Power Semiconductor Test Portfolio with ETS-800 Dual-Sector System


The system supports parallel site configurations for mass production while maintaining the adaptability needed for prototype or engineering runs.


This dual-sector approach directly addresses one of the most pressing challenges in modern semiconductor manufacturing: how to efficiently test a diverse mix of power devices used across the energy, industrial, and transportation sectors without sacrificing throughput or cost efficiency.


Driving Efficiency in Electrification and Industrial Power


Power semiconductors are critical components in applications such as electric vehicles (EVs), solar and battery energy storage systems (BESS), industrial motor drives, and aerospace power systems.


By combining high-parallel test capacity with configurable test head architectures, the ETS-800 D20 enables faster qualification and lower per-unit testing costs, an advantage that could help shorten production cycles and relieve pressure on global power device supply chains.


Teradyne’s latest system is also optimized for wide-bandgap devices, which operate at higher voltages and switching speeds than traditional silicon-based components.


These materials are essential for next-generation power systems that demand greater efficiency, compactness, and durability, key requirements in aerospace, defense, and renewable energy applications.


The system’s scalability gives both OEMs and contract manufacturers the flexibility to test new designs or ramp up production quickly without the need for separate test lines. This versatility is expected to attract strong interest from semiconductor fabs and test houses serving multiple end markets.

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